Characterization and Metrology

Chairman: Dr. Roberto Machorro (CNYN-UNAM), roberto@cnyn.unam.mx

Optic and electronic spectroscopy (EDX, XPS) and microscopy (SEM, TEM, AFM) are very important and relevant fields of knowledge when it comes to fundamental and applied research in materials science. For many centuries materials and surfaces have been widely studied and characterized by using linear optics through reflectance, transmittance, absorbance, and scattering properties. On the other hand, nonlinear optics are closely related to the understanding of materials and surfaces, since such phenomena for example, second harmonic generation, wave mixing, parametric up and down conversion to mention only a few are directly related to material features, such as, amorphous versus crystalline, or centrosymmetric versus non-centrosymmetric, anisotropic versus isotropic; quantum material properties can be probed by optical nonlinear phenomena like multiphoton excitation; defects population and electronic density show up when using time-resolved pump-probe optical spectroscopy. Structural features of a great selection of materials, including biomaterials, can be optically studied through Raman spectroscopy. Lasers play also a key role in the science and technology of materials and surfaces; its impact goes from fundamental light-matter interaction studies to laser micro and nanoprocessing for device fabrication, this path from light-matter interaction to laser-processing of materials constitutes the baseline for photonics. This symposium is dedicated to the presentation and discussion of characterization and metrology within the following topics:

• Materials
• Surfaces
• Linear and nonlinear optical properties
• Raman characterization
• Nonlinear optical microscopy
• Ultrafast light-matter interaction
• Laser processing of materials: micro and nanostructuring
• Laser-tissue interactions
• Laser-induced cavitation
• Photonics
• Biophotonics
• Opticaltrapping